Fluke MET/CAL Procedure ============================================================================= INSTRUMENT: Fluke 29-2: (1 year) CAL VER /5700,5725 INSTRUMENT: Fluke 79-2: (1 year) CAL VER /5700,5725 DATE: 16-Sep-97 AUTHOR: Fluke Corporation REVISION: $Revision: 2.8 $ ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 44 NUMBER OF LINES: 192 CONFIGURATION: Fluke 5700A CONFIGURATION: Fluke 5725A STANDARD: Capacitance Decade ============================================================================= # # Source: # Fluke 79/29 Series II Service Manual # (PN 896209 July 1991, Rev. 2, 1/94, Errata No. 1 11/94) # # Compatibility: # MET/CAL 4.0 or later # # Subprocedures: # None # # Required Files: # 57_2x-2.bmp # 57_7x-2.bmp # # System Specifications: # TUR calculation is based on specification interval of the accuracy file. # The default 5700A accuracy file contains 90 day specs. # # Fluke makes no warranty, expressed or implied, as to the fitness # or suitability of this procedure in the customer's application. # # The 90 day specifications of the 5700A are used in TUR computations. # STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- R N P F W 1.002 ASK+ K 1.003 MMFC C2 1.004 HEAD EQUIPMENT SETUP 1.005 DISP [32] WARNING 1.005 DISP HIGH VOLTAGE is used or exposed during the performance 1.005 DISP of this calibration. DEATH ON CONTACT may result if 1.005 DISP personnel fail to observe safety precautions. 1.006 DISP Allow the UUT to stablize to room temperature 1.006 DISP 23degC +/-5degC (73degF +/-9degF). 1.006 DISP 1.006 DISP Check the fuses and battery, and replace them if 1.006 DISP necessary. 1.007 HEAD {DISPLAY TEST} 1.008 DISP Rotate the UUT function switch from OFF to VAC. 1.008 DISP AS the UUT is turned ON, verify that all display 1.008 DISP segments momentarily light up. 1.009 EVAL Did the UUT display test pass? 2.001 HEAD {AC VOLTAGE TESTS} 2.002 JMPT 2.005 Fluke 29-2: (1 year) CAL VER /5700,5725 2.003 PIC 57_7x-2 2.004 JMP 2.006 2.005 PIC 57_2x-2 2.006 HEAD AC VOLTAGE TESTS: {400mV Range} 2.007 5700 0.0mV S 2W 2.008 MEMI Enter UUT reading in volts AC: 2.009 MEME 2.010 MEMC 400 mV +0.4U 3.001 5700 400 350.0mV 7.1U 100H 2W 4.001 5700 400 350.0mV 7.1U 1kH 2W 5.001 HEAD AC VOLTAGE TESTS: {4V Range} 5.002 DISP Press the push button twice to select the 4V Range. 5.003 5700 0.000V S 2W 5.004 MEMI Enter UUT reading in volts AC: 5.005 MEME 5.006 MEMC 4 V +0.002U 6.001 5700 4 3.500V 0.069U 100H 2W 7.001 5700 4 3.500V 0.069U 1kH 2W 8.001 HEAD AC VOLTAGE TESTS: {40V Range} 8.002 DISP Press the push button for 2s to select autorange. 8.003 5700 40 35.00V 0.37U 1kH 2W 9.001 HEAD AC VOLTAGE TESTS: {400V Range} 9.002 5700 400 350.0V 3.7U 1kH 2W 10.001 HEAD AC VOLTAGE TESTS: {750V Range} 10.002 5700 750 750V 10U 1kH 2W 11.001 HEAD {FREQUENCY TEST} 11.002 DISP Rotate the UUT function switch to Hz. 11.003 5700 800.0H 0.2U 300mV 2W 12.001 5700 20.00kH 0.01U 300mV 2W 13.001 HEAD {DC VOLTAGE TESTS} 13.002 DISP Rotate the UUT function switch to VDC. 13.003 HEAD DC VOLTAGE TESTS: {4V Range} 13.004 5700 4 0.000V 0.001U 2W 14.001 5700 4 3.500V 0.012U 2W 15.001 MATH M[1] = MEM1 15.002 5700 4 -3.500V 0.012U 2W 16.001 MATH M[2] = MEM1 16.002 HEAD DC VOLTAGE TESTS: {4V Range, +/- reading difference} # RSS sys tol = sqrt(2 * (2.15e-5)^2) 16.003 ACC 0V 3.0406e-5U 16.004 MATH MEM = M[1] + M[2] 16.005 MEME 16.006 MEMC 4 V 0.002U 17.001 HEAD DC VOLTAGE TESTS: {40V Range} 17.002 5700 40 35.00V 0.12U 2W 18.001 HEAD DC VOLTAGE TESTS: {400V Range} 18.002 5700 400 350.0V 1.2U 2W 19.001 HEAD DC VOLTAGE TESTS: {1000V Range} 19.002 5700 1000 1000V 4U 2W 20.001 HEAD {DC MILLIVOLT TEST} 20.002 DISP Rotate the UUT function switch to mVDC. 20.002 DISP Press push button for 1s to select autorange. 20.003 HEAD DC MILLIVOLT TEST: {400mV Range} 20.004 5700 400 350.0mV 1.2U 2W 21.001 HEAD DC MILLIVOLT TEST: {40mV Range} 21.002 5700 40 0.00mV 0.05U 2W 22.001 5700 40 35.00mV 0.16U 2W 23.001 5700 40 -35.00mV 0.16U 2W 24.001 HEAD {RESISTANCE TESTS} 24.002 DISP Rotate the UUT function switch to Ohms. 24.003 HEAD RESISTANCE TESTS: {400 Ohm Range} 24.004 5700 400 0.0Z +0.2U CW 25.001 5700 400 190.0Z 1.0U CW 26.001 HEAD RESISTANCE TESTS: {4 kOhm Range} 26.002 5700 4 1.900kZ 0.009U CW 27.001 HEAD RESISTANCE TESTS: {40 kOhm Range} 27.002 5700 40 19.00kZ 0.09U CW 28.001 HEAD RESISTANCE TESTS: {400 kOhm Range} 28.002 5700 400 190.0kZ 0.9U 2W 29.001 HEAD RESISTANCE TESTS: {4 MOhm Range} 29.002 5700 4 1.900MZ 0.009U 2W 30.001 HEAD RESISTANCE TESTS: {40 MOhm Range} 30.002 5700 40 19.00MZ 0.22U 2W 31.001 HEAD {CONTINUITY TEST} 31.002 DISP Rotate the UUT function switch to Continuity >>)). 31.003 5700 0Z S RW 31.004 EVAL Is the {beeper on}? 32.001 EVAL Is the {beeper off}? 33.001 EVAL Is UUT displaying the {overload indicator} (-OL.-)? 34.001 HEAD {DIODE TEST} 34.002 DISP Press the push button for 2s to select Diode (VDC) 34.003 5700 0Z S CW 34.004 EVAL Is the {beeper on}? 35.001 EVAL Is the {beeper off}? 36.001 EVAL Is UUT displaying the {overload indicator} (-OL.-)? 37.001 HEAD {DC MILLIAMP TEST} 37.002 DISP Rotate the UUT function switch to Amps DC. 37.003 HEAD DC MILLIAMP TESTS: {40mA Range} 37.004 5700 40 35.00mA 0.20U 2W 38.001 HEAD {AC MILLIAMP TESTS} 38.002 DISP Press the push button for 2s to select AC. 38.003 HEAD AC MILLIAMP TESTS: {40mA Range} 38.004 5700 40 35.00mA 0.55U 1kH 2W 39.001 HEAD {DC AMP TEST} 39.002 DISP Press the push button for 2s to select DC. 39.003 HEAD DC AMP TESTS: {10A Range} 39.004 5700 10 10.00A 0.07U B1 2W 40.001 DISP Disconnect the 5725A from the UUT. 40.002 HEAD {CAPACITANCE TESTS} 40.003 STD Capacitance Decade 40.004 DISP Rotate the UUT function switch to Ohms. 40.004 DISP Press the push button for 2s to select Capacitance. 40.005 ASK- U 40.006 HEAD CAPACITANCE TESTS: {100nF Range} 40.007 MATH MEM1 = 0.0 40.008 MEMI Enter UUT reading in nanofarads: 40.009 MEME 40.010 MEMC 100 nF +0.50U 41.001 HEAD CAPACITANCE TESTS: {1000nF Range} 41.002 DISP Press the push button twice to select the 1000nF Range. 41.003 MATH MEM1 = 0.0 41.004 MEMI Enter UUT reading in nanofarads: 41.005 MEME 41.006 MEMC 1000 nF +0.5U 42.001 ASK+ U 42.002 DISP Connect the Capacitance Decade and UUT as follows: 42.002 DISP [32] DECADE HI to UUT V Ohm DIODE 42.002 DISP [32] DECADE LO to UUT COM 42.003 DISP Set the Capacitance Decade to 800.0nF. # System tolerance must be modified to reflect the Capacitance Decade accuracy 42.004 ACC 800.0nF TOL 42.005 MEMI Enter UUT reading in nanofarads: 42.006 MEME 42.007 MEMC 1000 nF 15.4U 43.001 HEAD CAPACITANCE TESTS: {10uF Range} 43.002 DISP Press the push button to select the 10uF Range. 43.003 DISP Set the Capacitance Decade to 1.100uF. # System tolerance must be modified to reflect the Capacitance Decade accuracy 43.004 ACC 1.100uF TOL 43.005 MEMI Enter UUT reading in microfarads: 43.006 MEME 43.007 MEMC 10 uF 0.023U 44.001 END